New Ultra-Fast X-ray Diffraction DetectorAhrensburg, Germany — August 4, 2008 —The Meteor1D detector from GE Sensing & Inspection Technologies is the latest member of the evolving Meteor detector family for X-ray diffraction. Meteor1D creates a new standard for one-dimensional detectors in terms of faster detection and read-out speeds and high resolution, while offering extreme versatility within a compact and robust design. These are features which fit the new 1D detector for a wide range of applications including phase analysis and determination of retained austenite, kinetic experiments, involving in-situ phase transformations and residual stress, texture and thin film analysis. Typically, these applications are found in R&D departments at universities, research centres and in industrial organisations. For example, in the automotive and aerospace sectors, X-ray diffraction is seen as a valuable quality assurance tool. The new Meteor1D detector is the result of many years of development, deriving initially from academic synchrotron research. It uses the single photon counting principle and incorporates the latest semiconductor technology. Meteor1D is a maintenance-free detector which requires no gas nor even the minimum of cooling. No Beryllium is employed and the detector complies with the most stringent health and safety regulations. The Meteor1D detector has been designed to meet the requirements of the market, both today and in the future. It features a 64mm window to offer an exceptional capture angle which translates into extremely high speed. For example, measurement times are reduced by a factor of 200 when taking diffractograms compared with conventional detectors, allowing significant savings in time and costs. Similarly, read-out times of only 0.3ms make the detector ultra-fast, when compared with read-out times of the order of 100ms exhibited by many competitive detectors. Versatility is another benefit of the new detector as it can be operated both as a point (0D) and a linear (1D) detector. In static and in scanning mode, with energies ranging from 5keV (Cr) to 18keV (Mo), with a detection efficiency greater than 98% for copper. By designing the detector housing to accommodate a wide detection angle (2 Theta) of more than 170º, it is possible to perform stress measurements with extremely high reliability and accuracy. The Meteor1D can be easily retrofitted into existing Seifert XRD3000 and XRD3003 diffractometer systems and manipulation and handling systems can be designed to meet specific customer requirements.
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